{"id":764,"date":"2026-06-05T08:22:00","date_gmt":"2026-06-05T00:22:00","guid":{"rendered":"https:\/\/www.han-sphere.com\/?p=764"},"modified":"2026-07-29T23:13:10","modified_gmt":"2026-07-29T15:13:10","slug":"pcb-design-for-testability-dft-guide","status":"publish","type":"post","link":"https:\/\/www.han-sphere.com\/de\/blog\/news\/pcb-design-for-testability-dft-guide\/","title":{"rendered":"PCB-Design f\u00fcr Testbarkeit (DFT): Ein praktischer Leitfaden f\u00fcr bessere PCB-Tests"},"content":{"rendered":"<p class=\"wp-block-paragraph\">Probleme beim Testen beginnen oft schon beim Layout.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Eine Leiterplatte erreicht die Produktion und pl\u00f6tzlich:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>ICT kann nicht auf wichtige Signale zugreifen<\/li>\n\n\n<li>die Reichweite der fliegenden Sonde ist begrenzt<\/li>\n\n\n<li>die Fehlersuche dauert zu lange<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Das Board kann herstellbar sein.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Aber: Sie ist nicht \u00fcberpr\u00fcfbar.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Das ist der Ort, an dem <strong>DFT (Design f\u00fcr Testbarkeit)<\/strong> wichtig wird.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Gute DFT macht Tests:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>schneller<\/li>\n\n\n<li>billiger<\/li>\n\n\n<li>zuverl\u00e4ssiger<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Und was noch wichtiger ist:<\/p>\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<p class=\"wp-block-paragraph\">es verhindert teure \u00dcberraschungen w\u00e4hrend der Produktion.<\/p>\n<\/blockquote>\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"600\" height=\"405\" alt=\"pcba\" class=\"wp-image-732\" src=\"http:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/05\/pcba-2.jpg\" style=\"display: block; margin: 0 auto; max-width: 100%; height: auto; text-align: center;\" srcset=\"https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/05\/pcba-2.jpg 600w, https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/05\/pcba-2-300x203.jpg 300w, https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/05\/pcba-2-18x12.jpg 18w\" sizes=\"auto, (max-width: 600px) 100vw, 600px\" \/><\/figure>\n<\/div>\n\n<h2 class=\"wp-block-heading\">Was ist Design for Testability (DFT)?<\/h2>\n\n\n<p class=\"wp-block-paragraph\">DFT bedeutet, die Leiterplatte so zu gestalten, dass sie w\u00e4hrend der Fertigung und der Fehlersuche effektiv getestet werden kann.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Anstatt die Tests sp\u00e4ter hinzuzuf\u00fcgen, wird die DFT w\u00e4hrenddessen ber\u00fccksichtigt:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>schematisches Design<\/li>\n\n\n<li>PCB-Layout<\/li>\n\n\n<li>Montageplanung<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Das Ziel:<\/p>\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<p class=\"wp-block-paragraph\">die Fehlererkennung zu maximieren und gleichzeitig den Pr\u00fcfaufwand zu minimieren.<\/p>\n<\/blockquote>\n\n\n<h2 class=\"wp-block-heading\">Warum DFT wichtig ist<\/h2>\n\n\n<p class=\"wp-block-paragraph\">Schlechte Testbarkeit verursacht Probleme wie:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>geringe Testabdeckung<\/li>\n\n\n<li>schwierige Fehlersuche<\/li>\n\n\n<li>h\u00f6here Produktionskosten<\/li>\n\n\n<li>langsamere Fehlersuche<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">In Produktion:<\/p>\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<p class=\"wp-block-paragraph\">Die Behebung von Problemen mit der Testbarkeit nach dem Layout ist teuer.<\/p>\n<\/blockquote>\n\n\n<p class=\"wp-block-paragraph\">Eine gute DFT verbessert:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Fertigungseffizienz<\/li>\n\n\n<li>Fehlererkennung<\/li>\n\n\n<li>Produktzuverl\u00e4ssigkeit<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">\u00dcberblick: <strong><a href=\"https:\/\/www.han-sphere.com\/blog\/news\/pcb-testing-methods-quality-control\/\">PCB-Testmethoden erkl\u00e4rt<\/a><\/strong><\/p>\n\n\n<h2 class=\"wp-block-heading\">H\u00e4ufige Herausforderungen bei PCB-Tests<\/h2>\n\n\n<p class=\"wp-block-paragraph\">Viele Probleme wiederholen sich projekt\u00fcbergreifend.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Typische Themen sind:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>unzug\u00e4ngliche Pr\u00fcfpunkte<\/li>\n\n\n<li>\u00fcberf\u00fcllte Layouts<\/li>\n\n\n<li>versteckte Signale<\/li>\n\n\n<li>schlechter Zugang zu den Anschl\u00fcssen<\/li>\n\n\n<li>fehlende Debug-Schnittstellen<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Diese Probleme sind in der Regel konstruktionsbedingt.<\/p>\n\n\n<h2 class=\"wp-block-heading\">Wichtige DFT-Regeln f\u00fcr das PCB-Design<\/h2>\n\n\n<h3 class=\"wp-block-heading\">1. Gen\u00fcgend Testpunkte hinzuf\u00fcgen<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Dies ist die wichtigste Regel.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Ohne Testpunkte:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>IKT wird schwierig<\/li>\n\n\n<li>fliegende Sonde verlangsamt sich<\/li>\n\n\n<li>Fehlersuche wird frustrierend<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Bew\u00e4hrte Praxis:<\/p>\n\n\n<p class=\"wp-block-paragraph\">Testpunkte hinzuf\u00fcgen f\u00fcr:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Stromschienen<\/li>\n\n\n<li>Boden<\/li>\n\n\n<li>kritische Signale<\/li>\n\n\n<li>Kommunikationsbusse<\/li>\n<\/ul>\n\n\n<h4 class=\"wp-block-heading\">Tipps zur Platzierung von Testpunkten<\/h4>\n\n\n<p class=\"wp-block-paragraph\">Vermeiden Sie die Platzierung von Testpunkten:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>unter Komponenten<\/li>\n\n\n<li>in der N\u00e4he von hohen Teilen<\/li>\n\n\n<li>in unzug\u00e4nglichen Gebieten<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Halten Sie gen\u00fcgend Abstand f\u00fcr die Sonden ein.<\/p>\n\n\n<h3 class=\"wp-block-heading\">2. Plan f\u00fcr den IKT-Zugang<\/h3>\n\n\n<p class=\"wp-block-paragraph\">IKT erfordert K\u00f6rperkontakt.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Das bedeutet:<\/p>\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<p class=\"wp-block-paragraph\">muss ein Sondenzugang bestehen.<\/p>\n<\/blockquote>\n\n\n<p class=\"wp-block-paragraph\">Bedenken Sie:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Sondenabstand<\/li>\n\n\n<li>Spielraum der Vorrichtungen<\/li>\n\n\n<li>H\u00f6henbeschr\u00e4nkungen f\u00fcr Bauteile<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Verwandt: <strong><a href=\"https:\/\/www.han-sphere.com\/blog\/news\/ict-vs-flying-probe-pcb-testing\/\">ICT vs. Flying Probe Testing: Welcher PCB-Test ist besser?<\/a><\/strong><\/p>\n\n\n<h3 class=\"wp-block-heading\">3. Debug-Schnittstellen einbinden<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Die Fehlersuche wird mit Access wesentlich einfacher.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Gemeinsame Schnittstellen:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>UART<\/li>\n\n\n<li>JTAG<\/li>\n\n\n<li>SWD<\/li>\n\n\n<li>Programmierkopfzeilen<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Auch tempor\u00e4re Debugging-Pads helfen.<\/p>\n\n\n<h3 class=\"wp-block-heading\">4. Kennzeichnen Sie kritische Signale klar und deutlich<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Ein guter Siebdruck spart Entwicklungszeit.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Hilfreiche Etiketten:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Stromschienen<\/li>\n\n\n<li>Reset-Stifte<\/li>\n\n\n<li>Debug-Schnittstellen<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Das klingt einfach, hilft aber bei der Fehlersuche.<\/p>\n\n\n<h3 class=\"wp-block-heading\">5. Trennen Sie dichte Komponenten<\/h3>\n\n\n<p class=\"wp-block-paragraph\">\u00dcberf\u00fcllte Pl\u00e4tze verursachen Pr\u00fcfungsprobleme.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Lassen Sie einen angemessenen Zugang frei:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Steckverbinder<\/li>\n\n\n<li>ICs<\/li>\n\n\n<li>kritische Pr\u00fcfstellen<\/li>\n<\/ul>\n\n\n<h3 class=\"wp-block-heading\">6. Entwurf f\u00fcr Funktionstests<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Denken Sie \u00fcber die elektrische Pr\u00fcfung hinaus.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Fragen Sie:<\/p>\n\n\n<blockquote class=\"wp-block-quote is-layout-flow wp-block-quote-is-layout-flow\">\n<p class=\"wp-block-paragraph\">\u201cWie wird diese Tafel eigentlich getestet?\u201d<\/p>\n<\/blockquote>\n\n\n<p class=\"wp-block-paragraph\">Bedenken Sie:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Vorrichtungsschnittstelle<\/li>\n\n\n<li>Kommunikationsanschl\u00fcsse<\/li>\n\n\n<li>LEDs oder Anzeigen<\/li>\n\n\n<li>Diagnose-Firmware<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Verwandt: <strong><a href=\"https:\/\/www.han-sphere.com\/blog\/news\/functional-testing-pcb-assembly\/\">Funktionstests in der PCB-Best\u00fcckung<\/a><\/strong><\/p>\n\n\n<h3 class=\"wp-block-heading\">7. Bodenbezugspunkte hinzuf\u00fcgen<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Messungen werden damit einfacher:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>begehbare Bodenplatten<\/li>\n\n\n<li>stabile Referenz f\u00fcr die Sondierung<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Besonders wichtig bei der Fehlersuche.<\/p>\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"600\" height=\"449\" alt=\"Hochfrequenz-Leiterplatte\" class=\"wp-image-658\" src=\"http:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/high-frequency-PCB.jpg\" style=\"display: block; margin: 0 auto; max-width: 100%; height: auto; text-align: center;\" srcset=\"https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/high-frequency-PCB.jpg 600w, https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/high-frequency-PCB-300x225.jpg 300w, https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/high-frequency-PCB-16x12.jpg 16w\" sizes=\"auto, (max-width: 600px) 100vw, 600px\" \/><\/figure>\n<\/div>\n\n<h2 class=\"wp-block-heading\">DFT f\u00fcr verschiedene Pr\u00fcfverfahren<\/h2>\n\n\n<h3 class=\"wp-block-heading\">DFT f\u00fcr ICT<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Fokus auf:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>zug\u00e4ngliche Testpads<\/li>\n\n\n<li>Sondenabstand<\/li>\n\n\n<li>Kompatibilit\u00e4t der Vorrichtungen<\/li>\n<\/ul>\n\n\n<h3 class=\"wp-block-heading\">DFT f\u00fcr Flying Probe<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Fokus auf:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>erreichbare Netze<\/li>\n\n\n<li>ausreichender Zugang zur Sonde<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Die fliegende Sonde ist flexibler als ICT.<\/p>\n\n\n<h3 class=\"wp-block-heading\">DFT f\u00fcr Funktionstests<\/h3>\n\n\n<p class=\"wp-block-paragraph\">Fokus auf:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Software-Haken<\/li>\n\n\n<li>Debug-Anschl\u00fcsse<\/li>\n\n\n<li>Kommunikationsschnittstellen<\/li>\n<\/ul>\n\n\n<h2 class=\"wp-block-heading\">DFT vs. DFM vs. DFA<\/h2>\n\n\n<p class=\"wp-block-paragraph\">Diese Begriffe werden oft verwechselt.<\/p>\n\n\n<figure class=\"wp-block-table\"><table class=\"has-fixed-layout\"><thead><tr><th>Begriff<\/th><th>Bedeutung<\/th><th>Schwerpunkt<\/th><\/tr><\/thead><tbody><tr><td>DFT<\/td><td>Design f\u00fcr Testbarkeit<\/td><td>einfachere Tests<\/td><\/tr><tr><td>DFM<\/td><td>Design for Manufacturability<\/td><td>einfachere Herstellung<\/td><\/tr><tr><td>EDA<\/td><td>Design f\u00fcr die Montage<\/td><td>leichtere Montage<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n<p class=\"wp-block-paragraph\">Ein gutes PCB-Design ber\u00fccksichtigt in der Regel alle drei Aspekte.<\/p>\n\n\n<h2 class=\"wp-block-heading\">Wie man die Testbarkeit von PCBs verbessert<\/h2>\n\n\n<div class=\"schema-how-to wp-block-yoast-how-to-block\"> <ol class=\"schema-how-to-steps\"><li class=\"schema-how-to-step\" id=\"how-to-step-1780324125236\"><strong class=\"schema-how-to-step-name\">1. Fr\u00fchzeitige \u00dcberpr\u00fcfung der Teststrategie<\/strong> <p class=\"schema-how-to-step-text\">Die Tests sollten vor dem Layout geplant werden.<\/p> <\/li><li class=\"schema-how-to-step\" id=\"how-to-step-1780324131796\"><strong class=\"schema-how-to-step-name\">2. Fertigungsteams einbeziehen<\/strong> <p class=\"schema-how-to-step-text\">Leiterplattenbest\u00fccker erkennen DFT-Risiken oft fr\u00fchzeitig.<\/p> <\/li><li class=\"schema-how-to-step\" id=\"how-to-step-1780324137944\"><strong class=\"schema-how-to-step-name\">3. Zuerst Prototyp testen<\/strong> <p class=\"schema-how-to-step-text\">Verwenden Sie Prototypen zur Validierung:<br\/>. Abdeckung<br\/>. Zugang<br\/>. Vorrichtungskonzept<\/p> <\/li><li class=\"schema-how-to-step\" id=\"how-to-step-1780324161495\"><strong class=\"schema-how-to-step-name\">4. Standardisierung des Testzugangs<\/strong> <p class=\"schema-how-to-step-text\">Eine konsistente Platzierung tr\u00e4gt zur Effizienz der Produktion bei.<\/p> <\/li><\/ol><\/div>\n\n\n<h2 class=\"wp-block-heading\">H\u00e4ufige DFT-Fehler<\/h2>\n\n\n<p class=\"wp-block-paragraph\">Typische Probleme aus der Produktion:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Vergessen von Testpunkten<\/li>\n\n\n<li>unzug\u00e4ngliche Debug-Signale<\/li>\n\n\n<li>kein Spielraum f\u00fcr die Befestigung<\/li>\n\n\n<li>dichte Platzierung von Blockierungssonden<\/li>\n\n\n<li>nur auf die AOI-Inspektion vertrauen<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Testprobleme werden oft zu teuren Umgestaltungen.<\/p>\n\n\n<h2 class=\"wp-block-heading\">Praktische Hinweise aus der realen Produktion<\/h2>\n\n\n<p class=\"wp-block-paragraph\">Was \u00fcblicherweise geschieht:<\/p>\n\n\n<ul class=\"wp-block-list\">\n<li>Prototypenplatinen machen fehlenden Testzugang schnell sichtbar<\/li>\n\n\n<li>IKT-Fehler sind oft layoutbedingt<\/li>\n\n\n<li>Debug-Konnektoren sparen enorm viel Entwicklungszeit<\/li>\n\n\n<li>DFT-Planung reduziert die Fehlersuche in der Produktion drastisch<\/li>\n<\/ul>\n\n\n<p class=\"wp-block-paragraph\">Der g\u00fcnstigste Zeitpunkt, um \u00fcber Tests nachzudenken, ist w\u00e4hrend des Layouts.<\/p>\n\n<div class=\"wp-block-image\">\n<figure class=\"aligncenter size-full\"><img loading=\"lazy\" decoding=\"async\" width=\"600\" height=\"466\" alt=\"PCB \u00dcber\" class=\"wp-image-636\" src=\"http:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/PCB-Via-2.jpg\" style=\"display: block; margin: 0 auto; max-width: 100%; height: auto; text-align: center;\" srcset=\"https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/PCB-Via-2.jpg 600w, https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/PCB-Via-2-300x233.jpg 300w, https:\/\/www.han-sphere.com\/wp-content\/uploads\/2026\/04\/PCB-Via-2-15x12.jpg 15w\" sizes=\"auto, (max-width: 600px) 100vw, 600px\" \/><\/figure>\n<\/div>\n\n<h2 class=\"wp-block-heading\">Schlussfolgerung<\/h2>\n\n\n<p class=\"wp-block-paragraph\">Design for Testability (DFT) tr\u00e4gt dazu bei, dass eine Leiterplatte w\u00e4hrend der Herstellung und der Fehlersuche effizient getestet werden kann.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Durch die fr\u00fchzeitige Planung von Testpunkten, Testzugang und Debug-Schnittstellen k\u00f6nnen Ingenieure die Fehlerabdeckung verbessern, die Zeit f\u00fcr die Fehlersuche reduzieren und die Produktionskosten senken.<\/p>\n\n\n<p class=\"wp-block-paragraph\">Gute Tests beginnen lange vor der Produktion - sie beginnen bereits bei der Entwicklung.<\/p>\n\n\n<h2 class=\"wp-block-heading\">FAQ<\/h2>\n\n\n<div class=\"schema-faq wp-block-yoast-faq-block\"><div class=\"schema-faq-section\" id=\"faq-question-1780324209239\"><strong class=\"schema-faq-question\">F: Was ist DFT beim PCB-Design?<\/strong> <p class=\"schema-faq-answer\">A: DFT steht f\u00fcr \"Design for Testability\", was bedeutet, dass eine Leiterplatte so entworfen wird, dass sie leichter getestet werden kann.A: <\/p> <\/div> <div class=\"schema-faq-section\" id=\"faq-question-1780324220084\"><strong class=\"schema-faq-question\">F: Warum sind Pr\u00fcfpunkte wichtig?<\/strong> <p class=\"schema-faq-answer\">A: Sie erm\u00f6glichen den Zugang zu ICT, Flying Probe und Debugging.<\/p> <\/div> <div class=\"schema-faq-section\" id=\"faq-question-1780324230122\"><strong class=\"schema-faq-question\">F: Was ist der Unterschied zwischen DFT und DFM?<\/strong> <p class=\"schema-faq-answer\">A: DFT konzentriert sich auf das Testen, w\u00e4hrend DFM sich auf die Herstellbarkeit konzentriert.<\/p> <\/div> <div class=\"schema-faq-section\" id=\"faq-question-1780324244523\"><strong class=\"schema-faq-question\">F: Braucht jede Leiterplatte DFT?<\/strong> <p class=\"schema-faq-answer\">A: Ja, aber die H\u00f6he der DFT h\u00e4ngt von der Produktkomplexit\u00e4t und dem Produktionsvolumen ab.<\/p> <\/div> <div class=\"schema-faq-section\" id=\"faq-question-1780324257331\"><strong class=\"schema-faq-question\">F: Wann sollte eine DFT in Betracht gezogen werden?<\/strong> <p class=\"schema-faq-answer\">A: Bereits in der Phase des Entwurfs und des Layouts.<\/p> <\/div> <\/div>","protected":false},"excerpt":{"rendered":"<p>Design for Testability (DFT) tr\u00e4gt dazu bei, dass eine Leiterplatte w\u00e4hrend der Fertigung effizient und zuverl\u00e4ssig getestet werden kann. Bew\u00e4hrte DFT-Verfahren verk\u00fcrzen die Fehlerbehebungszeit, verbessern die Testabdeckung und senken die Produktionskosten. In diesem Artikel wird erl\u00e4utert, wie man eine Leiterplatte f\u00fcr eine bessere Testbarkeit entwirft.<\/p>","protected":false},"author":1,"featured_media":730,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_kad_post_transparent":"","_kad_post_title":"","_kad_post_layout":"","_kad_post_sidebar_id":"","_kad_post_content_style":"","_kad_post_vertical_padding":"","_kad_post_feature":"","_kad_post_feature_position":"","_kad_post_header":false,"_kad_post_footer":false,"_kad_post_classname":"","footnotes":""},"categories":[4],"tags":[68],"class_list":["post-764","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-news","tag-pcb-design-for-testability"],"yoast_head":"<!-- This site is optimized with the Yoast SEO plugin v26.5 - https:\/\/yoast.com\/wordpress\/plugins\/seo\/ -->\n<title>PCB Design for Testability (DFT): A Practical Guide for Better PCB Testing<\/title>\n<meta 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